客服热线:18202992950

MAGNETIC PROBE FOR MAGNETIC-FORCE MICROSCOPE 发明申请

2022-07-31 2790 100K 0

专利信息

申请日期 2024-11-18 申请号 JP2003144091
公开(公告)号 JP2004347435A 公开(公告)日 2004-12-09
公开国别 JP 申请人省市代码 全国
申请人 ISHIO SHUNJI; FUJI ELECTRIC HOLDINGS
简介 PROBLEM TO BE SOLVED : To manufacture a magnetic probe having a high spatial resolving power of about 20 nm to manufacture a magnetic recording medium having a recording density higher than conventional recording density. SOLUTION : The compositional ratio of a rare earth metal and a 3d transition metal, both of which constitute a magnetic alloy (especially an amorphous alloy material), is set so as to be received in a compensation compositional ratio or the compositional ratio in the vicinal region of the compensation compositional ratio when a magnetic body comprising the magnetic alloy is provided at the leading end part of the magnetic probe.


您还没有登录,请登录后查看下载地址


反对 0举报 0 收藏 0 打赏 0评论 0
下载排行
网站首页  |  关于我们  |  联系方式  |  使用协议  |  版权隐私  |  网站地图  |  排名推广  |  广告服务  |  积分换礼  |  网站留言  |  RSS订阅  |  违规举报