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ION SOURCE DEVICE AND ITS OPTIMUM CLEANING METHOD 发明申请

2022-07-31 2410 107K 0

专利信息

申请日期 2025-02-25 申请号 JP2003162763
公开(公告)号 JP2004363050A 公开(公告)日 2004-12-24
公开国别 JP 申请人省市代码 全国
申请人 SUMITOMO EATON NOVA
简介 PROBLEM TO BE SOLVED : To provide an ion source device for removing insulating film adhered to a lead out electrode system and its optimum cleaning method. SOLUTION : The ion source device 1 comprises a rare gas supply source 60 which supplies a rare gas instead of an ion source gas 10 into a plasma chamber and a means of determining time duration and timing for cleaning the electrodes based on the deposited amount of the insulating film adhered to the electrodes 20, 30, 40, 50 of the lead out electrode system, and by adjusting the lead out voltage and supply amount of the rare gas as a setting parameter, the insulating film is removed by sputtering of ion beam of the rare gas. In this method, the setting parameter for changing the beam diameter of ion beam of the rare gas at the time of colliding with each electrode face of the lead out electrode system 3 is adjusted, and by converging the ion beam of the rare gas within an effective setting range of beam diameter that has a high strength of sputtering the insulating film, the insulating film is uniformly removed.


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