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The composition and manufacture of resist pattern 发明授权

2022-06-06 4920 1702K 0

专利信息

申请日期 2025-02-25 申请号 JP2013223897
公开(公告)号 JP6306853B2 公开(公告)日 2018-04-04
公开国别 JP 申请人省市代码 全国
申请人 住友化学株式会社
简介 PROBLEM TO BE SOLVED : To provide a resist composition that enables production of a resist pattern with high resolution.SOLUTION : A resist composition contains a resin that includes a structural unit represented by formula (I) and a structural unit represented by formula (a4) and does not include an acid-labile group, a resin including an acid-labile group, an acid generator, and at least one compound selected from the group consisting of a compound represented by formula (II1) and a compound represented by formula (II2), wherein Rand Rare a hydrogen atom or a methyl group; Ris an alicyclic hydrocarbon group; Lis a divalent saturated hydrocarbon group or a single bond; Ris a saturated hydrocarbon group including a fluorine atom; and Ris an alkyl group which may have a substituent, an alicyclic hydrocarbon group or the like.


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